X-ray Photoelectron Spectroscopy (XPS) Reference Pages: Tin
Effects of Oxygen Ratio on the Properties of Tin Oxide Thin Films Doped with Bismuth - Bang - 2019 - physica status solidi (a) - Wiley Online Library
Figure 1 from X-ray photoemission spectroscopy (XPS) analysis on platinum doped stannic oxide ceramic | Semantic Scholar
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XPS Depth Profile of OLED Thin-Film
A complete and self-consistent evaluation of XPS spectra of TiN - ScienceDirect
Titanium nitride (TiN) is widely used due to its hardness, high electrical conductivity, corrosion resistance and high melting p
Figure 6 | Visible Light Photoelectrochemical Properties of N-Doped TiO2 Nanorod Arrays from TiN
XPS investigations of MOCVD tin oxide thin layers on Si nanowires array - ScienceDirect
XPS spectra of the (a) Sn 3d and (b) P 2p levels of the SnP/C... | Download Scientific Diagram
N1s XPS spectra of TiN films, recorded at (a) N.E. with respect to the... | Download Scientific Diagram
Titanium nitride (TiN) is widely used due to its hardness, high electrical conductivity, corrosion resistance and high melting p
Materials | Free Full-Text | Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium
Color online) chemical environments of TiN layers with XPS spectra of... | Download Scientific Diagram
XPS study of iodine and tin doped Sb2S3 nanostructures affected by n
XRD patterns (a) and XPS survey scan spectra (b) of the pristine Ti, TiN-coated and TaN-coated Ti: (bi) XPS wide spectra; the high-resolution Ti 2p spectra for the pristine Ti (bii), TiN-coated
X-Ray Photoelectron Spectroscopy Depth Profiling of As-Grown and Annealed Titanium Nitride Thin Films
XPS spectra of Sn 3d for tin oxide-based powders before and after... | Download Scientific Diagram
SnO by XPS: Surface Science Spectra: Vol 2, No 1
Stability & durability of self-driven photo-detective parameters based on Sn 1−β Sb β Se ( β = 0, 0.05, 0.10, 0.15, 0.20) ternary alloy single crystal ... - RSC Advances (RSC Publishing) DOI:10.1039/D2RA05492B
In Situ Analysis of Oxygen Vacancies and Band Alignment in HfO2/TiN Structure for CMOS Applications | SpringerLink
X-ray Photoelectron Spectroscopy (XPS) Reference Pages: Titanium Nitride
XPS study for CZTS thin films growth by PVD co-evaporation method
COPPER BRONZE POWDER SURFACE STUDIED BY XPS AND HR SEM
Complementary and bipolar regimes of resistive switching in TiN/HfO2/TiN stacks grown by atomic‐layer deposition - Egorov - 2015 - physica status solidi (a) - Wiley Online Library
